Veeco Dektak 150

Profilometers are used to measure the profile of a surface, in order to quantify its roughness. For the generation of a profile, a diamond tip is scanned laterally over the surface of the sample with a max scanned length of 55 mm. Typically a profilometer can measure small vertical features ranging in height from 10 nm to 1 mm.  The height position of the diamond stylus generates an analog signal which is converted into a digital signal stored, analyzed and displayed as a profile graph. The radius of the diamond stylus ranges from 10 nm to 25 μm, and the horizontal resolution is controlled by the scan speed and data signal sampling rate. The stylus tracking force can range from less than 1 to 50 mg.