Scanning Electron microscope

Scanning Electron Microscope 

A scanning electron microscope (SEM) is a type of microscope that uses a beam of electrons to scan a sample's surface. The scan is done using a high-energy beam of electrons that is focused on the sample with the help of magnets. The scan is done rapidly in a raster fashion. The electrons in the beam interact with the atoms on the sample producing signals that contain information about the sample's surface topography, composition and other properties as electrical conductivity. The end result is high analysis image of the sample with ultra high resolution down to a nanometer.

Our SEM is a Hitachi S-4800 system and can be used to obtain information of an sample's topography, morphology. In addition it equipped with a QUANTAX energy-dispersive spectrometer for quantitative analysis of samples providing detail information of a samples chemical composition. SEM is a valuable inspection tool for both research and industry.

Application areas:

  • Materials science
  • Failure analysis
  • Semiconductor and microelectronics
  • Forensic investigation
  • Life science
  • Medical science
  • Earth science