Scanning probe characterization

Atomic Force Microscope (Veeco Dimension 3100)

Atomic force microscopy (AFM) is a very-high resolution surface probe scanning technique offering details of surface morphology and topography down to the atomic scale.

Profilometer (Veeco Dektatk 150) 

A profilometer is a measuring instrument that can measure a surface's profile, so one can quantify its roughness. In addition it provides a fast method for step height measurments.

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